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The SPIE Digital Library is the most extensive resource available on optics and photonics, providing unprecedented access to more than 230,000 technical papers from SPIE Journals and Conference Proceedings from 1990 to the present. More than 17,000 new research papers are added annually.
Inspec provides indexing and abstracts of articles selected from nearly 5000 scientific and technical journals, with over 12 million records in the fields of electronics, computer science, physics, electrical, control, production and mechanical engineering.
The most comprehensive bibliographic database of technology and engineering research literature, containing citations and abstracts of articles and technical reports from over 5000 engineering journals and conferences.
Literature across all fields of science and social science. Comprehensive coverage of literature across all fields of science and social science. Provides access to more than 850 of Elsevier's primary research journals, which focus on scientific, medical, biomedical and technical areas.
Journals, books, and book series in the sciences including: chemical sciences, computer science, engineering, environmental sciences, geosciences, life sciences, mathematics, medicine, physics from the publisher, Springer-Verlag.
This site provides access to 12,000+ ASTM Standards, covering metals, petroleum, construction, the environment and more. Also included are almost every book, paper and chapter published by ASTM, nearly 30,000. Coverage dates are the current year and back file.
Literature published by 18 professional societies in physics and engineering.
This database includes literature published by 18 professional societies including the American Institute of Physics, Laser Institute of America, International Society for Optical Engineering, American Society of Mechanical Engineers, and American Society for Civil Engineers. We have full text access to only those journals for which we hold a subscription. Full abstracts are available for the entire database. Date coverage varies with the originating society and journal. You must register to search this database.